An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
A review paper presents an integrated AFM framework for observing, manipulating, and engineering ferroelectric materials at ...
Polymers are materials composed of repeated chains of molecules. Both natural and synthetic polymers possess many important properties that are influenced by the conformation and composition of ...
Competition is heating up in the atomic force microscopy (AFM) market, where several vendors are shipping new AFM systems that address various metrology challenges in packaging, semiconductors and ...
SAN JOSE, Calif. — KLA-Tencor Inc. and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments, Tuesday (August 31) said they have formed a distribution deal. Under the terms of the ...
In this interview, industry expert Louis Pacheco explores how advanced AFM techniques are transforming the characterization of solid-state polymer batteries, enabling researchers to optimize ...
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